Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures
- F. C.-P. Massabuau
- , S.-L. Sahonta
- , L. Trinh-Xuan
- , S. Rhode
- , T. J. Puchtler
- , M. J. Kappers
- , C. J. Humphreys
- , R. A. Oliver
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