Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
- C. Trager-Cowan
- , G. Naresh-Kumar
- , N. Allehiani
- , S. Kraeusel
- , B. Hourahine
- , S. Vespucci
- , D. Thomson
- , J. Bruckbauer
- , G. Kusch
- , P. R. Edwards
- , R. W. Martin
- , C. Mauder
- , A. P. Day
- , A. Winkelmann
- , A. Vilalta-Clemente
- , A. J. Wilkinson
- , P. J. Parbrook
- , M. J. Kappers
- , M. A. Moram
- , R. A. Oliver
- , C. J. Humphreys
- , P. Shields
- , E. D. Le Boulbar
- , D. Maneuski
- , V. O'Shea
- , K. P. Mingard
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